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3N165, 3N166
MONOLITHIC DUAL P-CHANNEL
Linear Integrated Systems
FEATURES
VERY HIGH INPUT IMPEDANCE HIGH GATE BREAKDOWN ULTRA LOW LEAKAGE LOW CAPACITANCE ABSOLUTE MAXIMUM RATINGS (NOTE 1) (TA= 25C unless otherwise noted) Drain-Source or Drain-Gate Voltage (NOTE 2) 3N165 3N166 Transient G-S Voltage (NOTE 3) Gate-Gate Voltage Drain Current (NOTE 2) Storage Temperature Operating Temperature Lead Temperature (Soldering, 10 sec.) Power Dissipation (One Side) Total Derating above 25C 40 V 30 V 125 V 80 V 50 mA -65C to +200C -55C to +150C +300C 300 mW 4.2 mW/C
ENHANCEMENT MODE MOSFET
1
7 C G1 G2 D2 S
3
5
D1
84
Device Schematic
TO-99 Bottom View
ELECTRICAL CHARACTERISTICS (TA=25C and VBS=0 unless otherwise specified) SYMBOL IGSSR IGSSF IDSS ISDS ID(on) VGS(th) VGS(th) rDS(on) gfs gos Ciss Crss Coss RE(Yfs) CHARACTERISTICS Gate Reverse Leakage Current Gate Forward Leakage Current Drain to Source Leakage Current Source to Drain Leakage Current On Drain Current Gate Source Threshold Voltage Gate Source Threshold Voltage Drain Source ON Resistance Forward Transconductance Output Admittance Input Capacitance Reverse Transfer Capacitance Output Capacitance LIMITS MIN. MAX. ------5 -2 -2 -1500 ----10 -10 -25 -200 -400 -30 -5 -5 300 3000 300 3.0 0.7 3.0 -s pF VDS= -15V (NOTE 4) VDS= -15V (NOTE 4) ID= -10mA f=100MHz ID= -10mA f=1MHz mA V V ohms s s pA UNITS VGS= 40 V VGS= -40 V TA=+125C VDS= -20 V VSD= -20 V VDS= -15 V VDS= -15 V VDS= VGS VGS= -20 V VDS= -15V VDB= 0 VGS= -10 V ID= -10 A ID= -10 A ID= -100 A ID= -10mA f=1kHz CONDITIONS
Common Source Forward Transconductance 1200
Linear Integrated Systems
4042 Clipper Ct., Fremont, CA 94538 TEL: (510) 490-9160 * FAX: (510) 353-0261
MATCHING CHARACTERISTICS 3N165 SYMBOL Yfs1/Yfs2 VGS1-2 CHARACTERISTICS Forward Transconductance Ratio Gate Source Threshold Voltage Differential Change with Temperature LIMITS MIN. MAX. 0.90 --1.0 100 100 mV V/C UNITS VDS= -15 V VDS= -15 V VDS= -15 V CONDITIONS ID= -500 A ID= -500 A IA= -500 A f=1kHz
VGS1-2/T Gate Source Threshold Voltage Differential
TA= -55C to = +25C
TYPICAL SWITCHING WAVEFORM VDD 10% 10% R1 R2 50 INPUT PULSE Rise Time 2ns Pulse Width 200ns Switching Times Test Circuit VOUT t on tr
90% 10%
t off
10%
SAMPLING SCOPE Tr 0.2ns CIN2pF RIN10M
Switching Times Test Circuit
NOTES:
1. MOS field-effect transistors have extremely high input resistance and can be damaged by the accumulation of excess static charge. To avoid possible damage to the device while wiring, testing, or in actual operation, follow these procedures: To avoid the build-up of static charge, the leads of the devices should remain shorted together with a metal ring except when being tested or used. Avoid unnecessary handling. Pick up devices by the case instead of the leads. Do not insert or remove devices from circuits with the power on, as transient voltages may cause permanant damage to the devices. 2. Per transistor. 3. Devices must mot be tested at 125V more than once, nor for longer than 300ms. 4. For design reference only, not 100% tested.
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Linear Integrated Systems
4042 Clipper Ct., Fremont, CA 94538 TEL: (510) 490-9160 * FAX: (510) 353-0261
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